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Bandgap opening in layered gray arsenic alloy
APL Materials ( IF 5.3 ) Pub Date : 2021-04-01 , DOI: 10.1063/5.0042050
Cheng Chen 1, 2 , Chang Li 2 , Qiang Yu 2 , Xinyao Shi 2 , Yushuang Zhang 3 , Jie Chen 1, 2 , Kaizhen Liu 4 , Ying He 1 , Kai Zhang 2
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As an essential member of group-V layered materials, gray arsenic (g-As) has recently begun to draw researchers’ attention due to fantastic physical properties predicted by theoretical calculation. However, g-As presents semimetal behavior as the thickness exceeds bilayers, which hinders its further device applications, such as in logic electronics. Herein, we report the growth of high quality gray arsenic–phosphorus–tin (g-AsPSn) alloys via a simple one-step chemical vapor transport process. The as-grown g-AsPSn alloy remains the same layered rhombohedral structure as g-As, while the g-AsPSn alloy shows an opened bandgap compared with g-As. Infrared absorption and photoluminescence spectra reveal a narrow optical bandgap of 0.2 eV. A field effect transistor based on few-layer g-AsPSn alloy flakes shows a typical p-type semiconductor behavior and a relatively high mobility of ∼66 cm2 V−1 S−1 under ambient conditions. It can be envisioned that the synthesized two-dimensional layered narrow-gap g-AsPSn alloy presents considerable potential applications in electronics and infrared optoelectronics.

中文翻译:

层状灰色砷合金中的带隙开口

作为V族层状材料的重要组成部分,由于理论计算所预测的出色物理性能,灰色砷(g-As)最近已引起研究人员的注意。然而,当厚度超过双层时,g-As表现出半金属特性,这阻碍了其进一步的器件应用,例如在逻辑电子学中。在这里,我们报告了通过简单的一步化学气相传输过程,高质量的灰色砷-磷-锡(g-AsPSn)合金的生长。刚生长的g-AsPSn合金与g-As保持相同的层状菱形结构,而g-AsPSn合金与g-As相比显示出开放的带隙。红外吸收和光致发光光谱显示出0.2 eV的窄光学带隙。在环境条件下为2  V -1 S -1。可以预见,合成的二维分层窄间隙g-AsPSn合金在电子学和红外光电子学中具有相当大的潜在应用。
更新日期:2021-04-30
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