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Advantages of a curved image plate for rapid laboratory-based x-ray total scattering measurements: Application to pair distribution function analysis
Review of Scientific Instruments ( IF 1.6 ) Pub Date : 2021-04-22 , DOI: 10.1063/5.0040694
Daniel J M Irving 1 , David A Keen 2 , Mark E Light 1
Affiliation  

The analysis and interpretation of the pair distribution function (PDF), as derived from total scattering measurements, is still seen by many as a technique confined to central synchrotron and neutron facilities. This situation has begun to change with a rising visibility of total scattering experiments reported in mainstream scientific journals and the modification of an increasing number of laboratory diffractometers. However, the rigor required during data reduction and the complexities of data interpretation mean the technique is still very far from being routine. Herein, we report the first application of a large area curved image plate system based on a Rigaku SPIDER (R-AXIS RAPID II) equipped with an Ag tube for collecting data amenable to high quality PDF refinement/modeling of crystalline, amorphous, and liquid samples. The advantages of such a system are the large Q range available without scanning (routinely in excess of 20 Å−1) and the inherent properties of an image plate detector (single photon sensitivity, large dynamic range [1.05 × 106], and effectively zero noise). Data are collected and structural models refined for a number of standard materials including NIST 640f silicon for which a Rwp ≤ 0.12 value was obtained with data collected in 60 min (excluding background measurements). These and other data are discussed and compared to similar examples in the literature.

中文翻译:

弧形图像板在基于实验室的X射线总散射快速测量中的优势:在成对分布函数分析中的应用

从总散射测量得出的对分布函数(PDF)的分析和解释仍然被许多人视为仅限于中央同步加速器和中子设施的技术。随着主流科学期刊报道的总散射实验的知名度不断提高,以及对越来越多的实验室衍射仪的改进,这种情况已经开始发生变化。但是,数据缩减过程中所要求的严格性以及数据解释的复杂性意味着该技术仍远非常规。本文中,我们报告了基于Rigaku SPIDER(R-AXIS RAPID II)的大面积曲面图像印版系统的首次应用,该系统配备了Ag管,用于收集适合于高质量PDF细化/结晶,无定形和液态建模的数据的Ag管样品。-1)和图像板检测器的固有属性(单光子灵敏度,较大的动态范围[1.05×10 6 ]和有效的零噪声)。数据的收集和精制了许多标准材料,包括NIST 640f硅为其A R的结构模型的wp用在60分钟内收集的数据(不包括背景测量)中获得≤0.12的值。对这些数据和其他数据进行了讨论,并与文献中的类似示例进行了比较。
更新日期:2021-04-30
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