The long-term stability of well-known TVO sensors before and after gamma irradiation was investigated during almost 17 years. Five of six sensors, calibrated in the temperature range from 3 to 300 K, were selected according to a requirement of their relative accuracy ΔT/T ≤ ± 0.25% at the cryogenic temperature range. Long-term stability measurements made 7.5 years after calibration are in good agreement with this value at 293, 77.3, and 4.2 K. Then these sensors and the sixth sensor, taken as the “worst” one for comparison, were irradiated by the ⁶⁰Co gamma source at room temperature up to the total dose of about 1 MGy. Noticeable relative temperature shifts (more than ± 0.25%) are revealed for all the sensors after irradiation, and this fact is explained based on the model of structural changes in the volume of the sensitive element. Post-irradiation measurements carried out during 9 years at 293, 77.3, and 4.2 K indicate good stability of the sensors after irradiation.

中文翻译：

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大剂量伽马射线辐照前后TVO低温传感器的长期稳定性

在将近17年的时间里，研究了著名的TVO传感器在伽马射线辐照前后的长期稳定性。6五个的传感器，在温度范围从3至300°K校准，根据它们的相对精度的要求选择Δ Ť / Ť  ≤±在低温温度范围内的0.25％。长期稳定性测量进行7.5年校准后分别与在293，77.3这个值非常吻合，和4.2 K.然后，这些传感器和第六传感器，取为“最差”一个作比较，是由照射⁶⁰室温下的γ射线源总剂量约为1 MGy。辐照后所有传感器的相对温度变化均明显（超过±0.25％），这一事实是根据敏感元件体积的结构变化模型进行解释的。在293、77.3和4.2 K下的9年中进行的辐照后测量表明，辐照后传感器具有良好的稳定性。