The performance of the Hodgkin-Huxley neuron circuits used in novel communication and computer systems depends on its capacitors. Thus, degradation of capacitors in neuron circuits may have significant impact on reliability of the neuron. In this paper, a simulation-based reliability assessment approach was developed for a Hodgkin-Huxley neuron circuit to consider the degradation of capacitors. SPICE simulation, neural information coding method, and degradation modelling of capacitors are integrated to assess impact of capacitors on the given neuron circuit. A MOS-based Hodgkin-Huxley neuron circuit is simulated to obtain output waveforms with degraded capacitors. It has been found that the output waveform of the selected neuron changes significantly with capacitors' degradation. In the total operation range of the neuron, degradation of capacitors may result in significant errors and loss of neural information. Capacitor's degradation elevates the duty ratio threshold for generating voltage spikes, and would lead to higher values of the inter-spike interval, regardless of variation of input period and duty cycle. However, by limitation of the input range and duty ration, information carried by S-Space code is transmitted correctly.

用于新型通信和计算机系统的霍奇金-赫克斯利（Hodgkin-Huxley）神经元电路的性能取决于其电容器。因此，神经元电路中电容器的退化可能会对神经元的可靠性产生重大影响。本文针对Hodgkin-Huxley神经元电路开发了一种基于仿真的可靠性评估方法，以考虑电容器的退化。集成了SPICE仿真，神经信息编码方法和电容器的退化模型，以评估电容器对给定神经元电路的影响。模拟了基于MOS的Hodgkin-Huxley神经元电路，以使用退化的电容器获得输出波形。已经发现，所选神经元的输出波形随着电容器的退化而显着变化。在神经元的总操作范围内，电容器的降级可能导致严重的错误和神经信息的丢失。电容器的劣化会提高用于产生电压尖峰的占空比阈值，并且会导致尖峰间隔的更高值，而与输入周期和占空比的变化无关。但是，由于输入范围和占空比的限制，由S-Space码携带的信息会正确传输。