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Super-resolution structured illumination microscopy: past, present and future
Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences ( IF 4.3 ) Pub Date : 2021-04-26 , DOI: 10.1098/rsta.2020.0143
Kirti Prakash 1, 2 , Benedict Diederich 3, 4 , Stefanie Reichelt 5 , Rainer Heintzmann 3, 4, 6 , Lothar Schermelleh 7
Affiliation  

Structured illumination microscopy (SIM) has emerged as an essential technique for three-dimensional (3D) and live-cell super-resolution imaging. However, to date, there has not been a dedicated workshop or journal issue covering the various aspects of SIM, from bespoke hardware and software development and the use of commercial instruments to biological applications. This special issue aims to recap recent developments as well as outline future trends. In addition to SIM, we cover related topics such as complementary super-resolution microscopy techniques, computational imaging, visualization and image processing methods.

This article is part of the Theo Murphy meeting issue ‘Super-resolution structured illumination microscopy (part 1)’.



中文翻译:

超分辨率结构照明显微镜:过去、现在和未来

结构照明显微镜 (SIM) 已成为三维 (3D) 和活细胞超分辨率成像的基本技术。然而,迄今为止,还没有专门的研讨会或期刊问题涵盖 SIM 的各个方面,从定制的硬件和软件开发以及商业仪器的使用到生物应用。本期特刊旨在回顾近期发展并概述未来趋势。除了 SIM 之外,我们还涵盖相关主题,例如互补的超分辨率显微镜技术、计算成像、可视化和图像处理方法。

本文是 Theo Murphy 会议问题“超分辨率结构照明显微镜(第 1 部分)”的一部分。

更新日期:2021-04-27
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