Structured illumination microscopy and image scanning microscopy are two microscopical tech- niques, rapidly increasing in practical application, that can result in improvement in transverse spatial resolution, and/or improvement in axial imaging performance. The history and principles of these techniques are reviewed, and the imaging properties of the two methods compared.

This article is part of the Theo Murphy meeting issue ‘Super-resolution structured illumination microscopy (part 1)’.

中文翻译：

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结构照明显微镜和图像扫描显微镜：成像特性的回顾和比较

结构照明显微镜和图像扫描显微镜是两种显微技术，在实际应用中迅速增加，可以提高横向空间分辨率，和/或提高轴向成像性能。回顾了这些技术的历史和原理，并比较了两种方法的成像特性。

本文是 Theo Murphy 会议问题“超分辨率结构照明显微镜（第 1 部分）”的一部分。