An accurate and efficient noise-based simulation technique for predicting the impact of device-parameter variability on the DC statistical behavior of integrated circuits is presented. The proposed method is validated on a source follower, a diode-load inverter and a current mirror based on organic thin-film transistors. Taking advantage of the standard noise analysis of a circuit, after translating the statistical variation of the electrical parameters of the transistors into equivalent-noise circuit components, the proposed technique yields results identical to those obtained from a Monte Carlo simulation, but in a significantly shorter amount of time.

中文翻译：

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基于噪声的电路可变性仿真技术

提出了一种准确有效的基于噪声的仿真技术，用于预测器件参数可变性对集成电路的直流统计行为的影响。该方法在源极跟随器，二极管负载逆变器和基于有机薄膜晶体管的电流镜上得到了验证。利用电路的标准噪声分析，在将晶体管的电参数的统计变化转换为等效噪声电路组件之后，所提出的技术产生的结果与从蒙特卡洛模拟获得的结果相同，但明显缩短了时间多少时间。