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Experimental study on fast electron generation during internal crash
Plasma Science and Technology ( IF 1.7 ) Pub Date : 2021-04-01 , DOI: 10.1088/2058-6272/abeda1
Chaowei MAI 1, 2 , Liqun HU 1 , Liqing XU 1 , Zhengping LUO 1 , Shiyao LIN 1 , Yiping CHEN 1 , EAST Team 1
Affiliation  

Hard x-ray (HXR) burst is found during internal crash in the flat top current stage of experimental advanced superconducting tokamak (EAST) discharges and it is caused by fast electrons. The generated electrons during internal crashes may be an operational safety issue in advanced tokamaks. During an internal crash, locations of fast electron generation from HXR evolution agree with areas of magnetic reconnection from soft x-ray (SXR) tomographic reconstruction. Further statistical analyses show a 27 μs time difference between SXR crashes and HXR bursts, and the agreement between time broadening of HXR bursts and estimated characteristic time of magnetic reconnection in EAST. The magnetic reconnections during internal crash are proved to generate fast electrons, by both spatial and temporal agreements.



中文翻译:

内部碰撞过程中快速产生电子的实验研究

硬 X 射线 (HXR) 爆发是在实验性先进超导托卡马克 (EAST) 放电的平顶电流阶段的内部碰撞期间发现的,它是由快速电子引起的。内部碰撞期间产生的电子可能是先进托卡马克的操作安全问题。在内部碰撞期间,来自 HXR 演化的快速电子生成位置与来自软 X 射线 (SXR) 断层扫描重建的磁重联区域一致。进一步的统计分析表明27 μ HXR突发的时间展宽和在EAST磁重的估计特征时间之间的协议之间SXR崩溃和HXR突发的时间差,和。通过空间和时间协议,内部碰撞期间的磁重联被证明会产生快速电子。

更新日期:2021-04-01
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