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Detection of atmospheric pressure plasma-induced removal of fingerprints via analysis of histograms obtained by imaging ellipsometry
Journal of Physics Communications ( IF 1.1 ) Pub Date : 2021-04-14 , DOI: 10.1088/2399-6528/abf3a4
N A Koulouris 1 , D Tasche 1, 2 , A Scheglov 1 , J Mrotzek 1, 3 , C Gerhard 1 , W Vil 1, 3
Affiliation  

In this publication we report on the suitability of imaging ellipsometry for the semi-quantitative investigation of a contactless removal of human fingerprints from surfaces by an atmospheric pressure plasma tretament. Special attention is paid to the impact of the applied plasma on the complex mixture of biological substances of a fingerprint. For this purpose, the cleaning effect of an argon plasma at two different electrical powers is investigated. By using imaging ellipsometry as a analysis method it could be shown that the cleaning efficiency increases with increasing electrical power and plasma treatment time. In addition, measurements were made by means of x-ray photoelectron spectroscopy (XPS) in order to characterize the chemical composition of surface-adherent contamination and its plasma-induced modifications. It was found that especially the amount of organic impurities is reduced in the course of plasma treatment.



中文翻译:

通过分析椭偏成像获得的直方图检测大气压等离子体诱导的指纹去除

在本出版物中,我们报告了成像椭圆光度法在通过大气压等离子体处理从表面非接触式去除人类指纹的半定量研究中的适用性。特别注意施加的等离子体对指纹生物物质的复杂混合物的影响。为此,研究了氩等离子体在两种不同电功率下的清洁效果。通过使用成像椭偏仪作为分析方法,可以表明清洁效率随着电功率和等离子体处理时间的增加而增加。此外,通过 X 射线光电子能谱 (XPS) 进行测量,以表征表面粘附污染物的化学成分及其等离子体诱导的改性。

更新日期:2021-04-14
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