One of the primary elements influencing gaseous detector operation is the purity of the gas mixture. Its quality can be undermined by the presence of impurities, already present in the supply gas bottles or that could be created in the gas system or from the detector itself. Gaseous detectors operated with Freon-based gas mixtures are subject to the formation of the products of gas molecules break up, occurring when the gas is exposed to high-rate radiation, and enhanced by the presence of high electric field. The release of highly reactive products could be critical as they could either create polymerized deposits or cause material etching, that could compromise detector performance and accelerate aging processes. Moreover, the operation of gas systems with gas recirculation, nowadays common in many gas systems, could worsen the risk of damage due to possible impurities accumulation. This work focuses on the production of fluorine-based impurities in Triple-GEMs detectors operated with C${\mathrm{F}}_4$-based gas mixture. Detectors are operated in a LHC-like gas system and exposed to high-rate gamma irradiation thanks to the intense ¹³⁷Cs source provided by the CERN Gamma Irradiation Facility (GIF++). Impurity production is characterized for different detector operation conditions such as gas mixture, working voltage, input flow rate, and irradiation rates. Furthermore, purifier module operation is validated proving its efficiency in removing Fluoride impurities.

影响气体检测器操作的主要因素之一是气体混合物的纯度。杂质的存在可能会削弱其质量，这些杂质已经存在于供气瓶中，或者可能在气体系统中或由检测器本身产生。使用基于氟利昂的气体混合物运行的气体检测器容易形成气体分子分解的产物，这种分解是在气体暴露于高速率辐射时发生的，并且由于存在高电场而增强。高反应性产物的释放可能至关重要，因为它们可能产生聚合沉积物或引起材料蚀刻，从而可能损害检测器性能并加速老化过程。此外，如今在许多燃气系统中，带燃气再循环的燃气系统的运行非常普遍，可能会由于可能的杂质积累而加剧损坏的风险。这项工作的重点是在使用C的Triple-GEMs检测器中产生氟基杂质${\mathrm{F}}_4$基混合气体。由于CERN伽马辐照设施（GIF ++）提供的¹³⁷ Cs强烈辐射源，探测器在类似LHC的气体系统中运行，并受到高速伽马辐照。杂质产生的特征是针对不同的检测器操作条件，例如气体混合物，工作电压，输入流量和辐照率。此外，净化器模块的运行已得到验证，证明了其去除氟化物杂质的效率。