The X-ray differential phase-contrast imaging (DPCI) based on Talbot-Lau interferometers (TLIs) is a promising imaging technique for non-destructive testing. The compact imaging configurations that have a large field-of-view (FoV) require the use of bent phase gratings and large-area analyzer gratings. The cascaded TLIs reduce the aspect ratio requirement of large-area analyzer gratings, which facilitates the fabrication of these gratings. However, the bent silicon-based phase gratings are difficult to obtain directly because of the brittleness of silicon wafers. In this work, we present a method to prepare 5-inch cylindrically bent silicon-based phase gratings and 8-inch analyzer gratings. Moreover, we also present their applications in the cascaded TLIs. The mechanical stress that originates from thermal oxidation enables us to cylindrically bend silicon-based phase gratings. Furthermore, as compared to the use of plane phase gratings, the use of cylindrically bent phase gratings allows Moiré fringes to appear in the entire 8-inch FoV. Finally, Moiré fringes and multi-contrast images of the samples (water, liquid soap filled in heat-shrink tubes) demonstrate the effectiveness of the fabrication of the bent silicon-based phase gratings and imaging in the entire 8-inch FoV. The proposed configuration is applicable for attaining multi-contrast images with 8-inch FoV at a low cost.

基于Talbot-Lau干涉仪（TLIs）的X射线微分相衬成像（DPCI）是一种用于无损检测的有前途的成像技术。具有大视场（FoV）的紧凑型成像配置需要使用弯曲相位光栅和大面积分析仪光栅。级联的TLI降低了大面积分析仪光栅的长宽比要求，从而简化了这些光栅的制造。然而，由于硅晶片的脆性，难以直接获得弯曲的基于硅的相位光栅。在这项工作中，我们提出了一种制备5英寸圆柱弯曲的硅基相位光栅和8英寸分析仪光栅的方法。此外，我们还介绍了它们在级联TLI中的应用。源于热氧化的机械应力使我们能够圆柱形弯曲硅基相位光栅。此外，与使用平面相位光栅相比，使用圆柱形弯曲相位光栅可使莫尔条纹出现在整个8英寸FoV中。最后，样品的莫尔条纹和多对比度图像（水，填充在热缩管中的液体肥皂）显示出弯曲的硅基相位光栅的制造和整个8英寸FoV成像的有效性。所提出的配置适用于以低成本获得具有8英寸FoV的多对比度图像。样品的莫尔条纹和多对比度图像（水，填充在热缩管中的液体肥皂）显示出弯曲的硅基相位光栅的制造和整个8英寸FoV成像的有效性。所提出的配置适用于以低成本获得具有8英寸FoV的多对比度图像。样品的莫尔条纹和多对比度图像（水，填充在热缩管中的液体肥皂）显示出弯曲的硅基相位光栅的制造和整个8英寸FoV成像的有效性。所提出的配置适用于以低成本获得具有8英寸FoV的多对比度图像。