Abstract

The temperature dependence of the relative dielectric losses of an irradiated KCl–Ag crystal is investigated. It is established that neutral complex defects are caused by different types of relaxation oscillators and have different structures. The quasi-oscillating temperature dependence of the relative concentration of neutral complex defects, which cause dielectric losses at different frequencies, is established. The formation and decay of neutral complex defects based on the concept of the trophic chain of defects are theoretically substantiated. The concept of the interaction radius is introduced, when mobile defects can enter a quasi-chemical reaction, and neutral complex defects begin to form. The radius of this interaction will be proportional to the concentration of free mobile defects. In the steady-state mode, when kinetic equilibrium is established for all components of the trophic chain of defects, the equation for the temperature dependence of the radius of the interaction of defects is considered, which explains the oscillating properties of the relative concentration of neutral complex defects in ionic crystals.

中文翻译：

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非金属晶体热退火过程中中性缺陷的准振荡特性

摘要

研究了辐照的KCl-Ag晶体的相对介电损耗的温度依赖性。已确定中性复杂缺陷是由不同类型的张弛振荡器引起的，并且具有不同的结构。建立了在不同频率下引起电介质损耗的中性复合缺陷相对浓度的准振荡温度依赖性。理论上证实了基于缺陷营养链概念的中性复杂缺陷的形成和衰变。当可移动缺陷可以进入准化学反应并开始形成中性复杂缺陷时，引入了相互作用半径的概念。这种相互作用的半径将与自由移动缺陷的浓度成正比。在稳态模式下，