We attempted to reproduce the total electron content (TEC) variation in the Earth's atmosphere from the temporal variation of the solar flare spectrum of the X9.3 flare on September 6, 2017. The flare spectrum from the Flare Irradiance Spectral Model (FISM), and the flare spectrum from the 1D hydrodynamic model, which considers the physics of plasma in the flare loop, are used in the GAIA model, which is a simulation model of the Earth's whole atmosphere and ionosphere, to calculate the TEC difference. We then compared these results with the observed TEC. When we used the FISM flare spectrum, the difference in TEC from the background was in a good agreement with the observation. However, when the flare spectrum of the 1D-hydrodynamic model was used, the result varied depending on the presence or absence of the background. This difference depending on the models is considered to represent which extreme ultraviolet (EUV) radiation is primarily responsible for increasing TEC. From the flare spectrum obtained from these models and the calculation result of TEC fluctuation using GAIA, it is considered that the enhancement in EUV emission by approximately 15–35 nm mainly contributes in increasing TEC rather than that of X-ray emission, which is thought to be mainly responsible for sudden ionospheric disturbance. In addition, from the altitude/wavelength distribution of the ionization rate of Earth's atmosphere by GAIA (Ground-to-topside Atmosphere and Ionosphere model for Aeronomy), it was found that EUV radiation of approximately 15–35 nm affects a wide altitude range of 120–300 km, and TEC enhancement is mainly caused by the ionization of nitrogen molecules.

我们尝试从2017年9月6日X9.3耀斑的太阳耀斑光谱的时间变化中再现地球大气中的总电子含量（TEC）变化。来自耀斑辐照光谱模型（FISM）的耀斑光谱， GAIA模型是地球整个大气层和电离层的模拟模型，利用一维流体动力学模型的火炬光谱（考虑了火炬回路中等离子体的物理性质）来计算TEC差。然后，我们将这些结果与观察到的TEC进行了比较。当我们使用FISM耀斑光谱时，与背景的TEC差异与观察值非常吻合。但是，当使用一维流体动力学模型的耀斑光谱时，结果会根据背景的存在或不存在而变化。取决于模型的差异被认为代表了哪种极端紫外线（EUV）辐射是增加TEC的主要原因。从这些模型获得的耀斑光谱以及使用GAIA进行TEC波动的计算结果，可以认为EUV排放提高了约15倍。– 35 nm主要是增加TEC而不是增加X射线的发射，这被认为是造成电离层突然扰动的主要原因。另外，从通过GAIA的地球大气电离率的高度/波长分布（地面至顶侧大气层和电离层模型为高层大气物理学），人们发现，大约15的EUV辐射- 35纳米影响的宽高度范围120 – 300 km，TEC增强主要是由氮分子的电离引起的。