A methodology is proposed to emulate and assess the single event effect in configuration memory on 16 nm Ultrascale+ MPSoC. The solution depends on fault injection and fault tree analysis. Three image processing applications, including histogram computation, image stretch and sobel edge detection, are used as the benchmarks. The results demonstrate 38.1% to 40.5% system errors cannot be recovered, although the SEM sub-system is adopted to recover the corresponding upset in the configuration memory.

中文翻译：

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使用故障注入和故障树分析对16 nm Ultrascale + MPSoC进行可靠性评估

提出了一种方法来仿真和评估16 nm Ultrascale + MPSoC上配置存储器中的单事件效应。解决方案取决于故障注入和故障树分析。基准测试使用了三种图像处理应用程序，包括直方图计算，图像拉伸和sobel边缘检测。结果表明，尽管采用了SEM子系统来恢复配置存储器中的相应故障，但无法恢复38.1％至40.5％的系统错误。