Abstract

The process \(e^{+}e^{-}\to\omega\pi^{0}\to\pi^{+}\pi^{-}\pi^{0}\pi^{0}\) was studied in the energy range between 1 and 2 GeV to the best precision in the world. The data used correspond to an integrated luminosity of \(35\text{ pb}^{-1}\) accumulated with the SND detector at the VEPP-2000 \(e^{+}e^{-}\) collider. The statistical accuracy of the measured cross section is 2 to 22\(\%\), whereas the systematic uncertainty is 2.6 to 14\(\%\). The present results agree with the results of earlier measurements but have a better precision.

中文翻译：

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测量过程的横截面$$ {e ^ {+} e ^ {-}} {\至} {\ omega \ pi} ^ {{0}} {\至} {\ pi} ^ {{+ }} {\ pi} ^ {{-}} {\ pi} ^ {{0}} {\ pi} ^ {{0}} $$和SND检测器

摘要

进程\（e ^ {+} e ^ {-} \ to \ omega \ pi ^ {0} \ to \ pi ^ {+} \ pi ^ {-} \ pi ^ {0} \ pi ^ {0} \）在1至2 GeV的能量范围内进行了研究，以达到世界上最高的精度。所使用的数据对应于在VEPP-2000 \（e ^ {+} e ^ {-} \）对撞机上用SND检测器累积的\（35 \ text {pb} ^ {-1} \）的综合亮度。测量横截面的统计精度为2至22 \（\％\），而系统不确定度为2.6至14 \（\％\）。目前的结果与早期的测量结果一致，但精度更高。