Zinc oxide (ZnO) thin films have been deposited onto fluorine-doped tin oxide substrates (FTO) using sol–gel spin-coating technique with different sol stabilizers. The effect of sol stabilizers on structural, morphological, optical, and photoelectrochemical properties of the ZnO films was investigated. XRD analysis shows that all ZnO films have a polycrystalline hexagonal wurtzite structure with a preferred growth orientation along the (101), and the average of crystallites size varies from 46,277 to 82,266 nm. Room temperature photoluminescence (PL) spectra indicate a UV emission at around 380 nm originated from nearby band-edge transitions. Also, we investigated the effects of sol-stabilizers on the photoelectrochemical (PEC) properties of all ZnO photoanodes, and the best photocurrent density was evaluated at around 1710^–4 A cm⁻². Finally, donor density and flat-band potential of the different ZnO elaborated photoanodes were deduced from the Mott-Schottky plots.

氧化锌（ZnO）薄膜已使用具有不同溶胶稳定剂的溶胶-凝胶旋涂技术沉积在掺氟的氧化锡衬底（FTO）上。研究了溶胶稳定剂对ZnO薄膜的结构，形态，光学和光电化学性质的影响。XRD分析表明，所有ZnO膜均具有多晶六方纤锌矿结构，沿（101）方向具有较好的生长方向，并且微晶的平均尺寸在46277至82266 nm之间变化。室温光致发光（PL）光谱表明大约380 nm处的紫外线发射是由附近的带边跃迁引起的。此外，我们研究了溶胶稳定剂对所有ZnO光阳极的光电化学（PEC）性能的影响，并在1710左右评估了最佳光电流密度^–4 A cm ^-2。最后，从莫特-肖特基图推导出不同的ZnO精细化的光阳极的供体密度和平坦带电势。