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Unifying the concepts of scattering and structure factor in ordered and disordered samples
Journal of Applied Crystallography ( IF 6.1 ) Pub Date : 2021-03-31 , DOI: 10.1107/s1600576721001965
Dingning Li , Kai Zhang

Scattering methods are widely used in many research areas to analyze and resolve material structures. Given its importance, a large number of textbooks are devoted to this topic. However, technical details in experiments and disconnection between explanations from different perspectives often confuse and frustrate beginner students and researchers. To create an effective learning path, the core concepts of scattering and structure factor are reviewed in this article in a self‐contained way. Classical examples of scattering photography and intensity scanning are calculated. Sample CPU and GPU codes are provided to facilitate the understanding and application of these methods.

中文翻译:

统一有序和无序样本中散射和结构因子的概念

散射方法在许多研究领域中广泛用于分析和解析材料结构。鉴于其重要性,大量的教科书都专门针对该主题。但是,实验中的技术细节以及不同角度的解释之间的脱节常常使初学者和研究人员感到困惑和沮丧。为了创建有效的学习路径,本文以独立的方式回顾了散射和结构因子的核心概念。计算了散射摄影和强度扫描的经典示例。提供了示例CPU和GPU代码以促进对这些方法的理解和应用。
更新日期:2021-04-06
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