Structured illumination microscopy (SIM) has become a widely used tool for insight into biomedical challenges due to its rapid, long-term, and super-resolution (SR) imaging. However, artifacts that often appear in SIM images have long brought into question its fidelity, and might cause misinterpretation of biological structures. We present HiFi-SIM, a high-fidelity SIM reconstruction algorithm, by engineering the effective point spread function (PSF) into an ideal form. HiFi-SIM can effectively reduce commonly seen artifacts without loss of fine structures and improve the axial sectioning for samples with strong background. In particular, HiFi-SIM is not sensitive to the commonly used PSF and reconstruction parameters; hence, it lowers the requirements for dedicated PSF calibration and complicated parameter adjustment, thus promoting SIM as a daily imaging tool.

由于其快速，长期和超分辨率（SR）成像，结构照明显微镜（SIM）已成为了解生物医学挑战的一种广泛使用的工具。但是，经常出现在SIM图像中的伪像早已使人质疑其保真度，并可能导致对生物结构的误解。通过将有效点扩展函数（PSF）设计成理想形式，我们提出了一种高保真SIM重构算法HiFi-SIM。HiFi-SIM可以有效地减少常见的伪影，而不会损失精细的结构，并且可以改善具有强背景的样本的轴向截面。特别是，HiFi-SIM对常用的PSF和重建参数不敏感；因此，它降低了专用PSF校准和复杂参数调整的要求，