We have designed and evaluated a cryo-electron microscopy (cryo-EM) system for higher-resolution single particle analysis and high-precision electron 3D crystallography. The system comprises a JEOL CRYO ARM 300 electron microscope-the first machine of this model-and a direct detection device camera, a scintillator-coupled camera, GPU clusters connected with a camera control computer and software for automated-data collection and efficient and accurate operation. The microscope provides parallel illumination of a highly coherent 300-kV electron beam to a sample from a cold-field emission gun and filters out energy-loss electrons through the sample with an in-column energy filter. The gun and filter are highly effective in improving imaging and diffraction, respectively, and have provided high quality data since July 2018. We here report on the characteristics of the cryo-EM system, updates, our progress and future plan for running such cryo-EM machines in RIKEN SPring-8 Center.

中文翻译：

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使用冷场发射光束和能量过滤的冷冻电镜和 ED 的进展

我们设计并评估了用于更高分辨率单粒子分析和高精度电子 3D 晶体学的低温电子显微镜 (cryo-EM) 系统。该系统包括一台 JEOL CRYO ARM 300 电子显微镜——该型号的第一台机器——和一个直接检测设备摄像头、一个闪烁体耦合摄像头、与摄像头控制计算机相连的 GPU 集群和用于自动数据收集和高效准确的软件手术。显微镜从冷场发射枪向样品提供高度相干的 300 kV 电子束的平行照明，并使用柱内能量过滤器过滤掉通过样品的能量损失电子。枪和滤光片分别在改善成像和衍射方面非常有效，并且自 2018 年 7 月以来提供了高质量的数据。