Structured illumination microscopy (SIM), is a wide-field, minimally-invasive super-resolution optical imaging approach with optical sectioning capability, and it has been extensively applied to many different fields. During the past decades, SIM has been drawing great attention for both the technique development and applications. In this review, firstly, the basic conception, instrumentation, and functionalities of SIM are introduced concisely. Secondly, recent advances in SIM which enhance SIM in different aspects are reviewed. Finally, the variants of SIM are summarized and the outlooks and perspectives of SIM are presented.

中文翻译：

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结构照明显微镜的最新进展

结构照明显微镜（SIM）是一种具有光学切片能力的宽视野、微创超分辨率光学成像方法，已广泛应用于许多不同领域。在过去的几十年中，SIM 技术的发展和应用都受到了极大的关注。在这篇综述中，首先简要介绍了 SIM 的基本概念、仪器和功能。其次，回顾了 SIM 在不同方面增强 SIM 的最新进展。最后，总结了SIM的变种，并提出了SIM的展望和前景。