This study introduces an easy methodology to test and analyze experimental field electron emission current-voltage data from metallic single-tip emitters; this novel and easy methodology is called the Murphy–Good plots. Tungsten electron emitters were used as an example and were prepared by the electrochemical etching process. The current-voltage characteristics are obtained in high vacuum levels and using a traditional field emission microscope. Murphy–Good plots are used to apply the well-known field electron emission orthodoxy test to the experimental data and then to extract the emitters’ characterization parameters if the test is passed. The novelty in using this type of plots lies in its independency on any correction factors, unlike the traditional Fowler–Nordheim and Millikan–Lauritsen plots, in addition to its simple theoretical form. The results are calculated using a simple web tool that applies the field electron emission orthodoxy test to any type of the current-voltage analysis plots and then to extract the characterization parameters of the emitters.

中文翻译：

---

从墨菲的信息提取–钨场电子发射器的良好图

这项研究引入了一种简单的方法来测试和分析来自金属单尖端发射器的实验场电子发射电流-电压数据；这种新颖，简单的方法称为“墨菲-好图”。以钨电子发射器为例，并通过电化学刻蚀工艺制备。电流-电压特性是在高真空度下使用传统的场发射显微镜获得的。墨菲-古德图用于将众所周知的场电子发射正统测试应用于实验数据，然后在测试通过的情况下提取发射器的表征参数。与传统的Fowler-Nordheim和Millikan-Lauritsen图不同，除了使用简单的理论形式之外，使用这种类型的图的新颖之处还在于它可以独立于任何校正因子。