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Handling of Multiple‐Wave Effects in the Measurement of Forbidden X‐Ray Reflections in TeO2
Crystal Research and Technology ( IF 1.5 ) Pub Date : 2021-03-22 , DOI: 10.1002/crat.202000195
Ksenia A. Kozlovskaya 1 , Anton G. Kulikov 2 , Dmitri Novikov 3 , Elena N. Ovchinnikova 1 , Alexey M. Ustyugov 1 , Vladimir E. Dmitrienko 2
Affiliation  

Multiple‐wave X‐ray reflections usually aggravate the measurement of Bragg reflections, especially of weak “forbidden” reflections. Accurate analysis of multiple‐wave peaks usually allows to avoid this. However, multiple‐wave reflections can also provide information about crystal structure, since crystal cell parameters determine the positions of multi‐wave peaks. The forbidden reflections 002 and 100 in paratellurite are measured and an approach based on semi‐kinematical X‐ray scattering used to handle the multiple‐wave interferences is shown here.

中文翻译:

TeO2中禁止X射线反射测量中的多波效应处理

多波X射线反射通常会加剧布拉格反射的测量,尤其是弱的“禁止”反射。准确地分析多波峰通常可以避免这种情况。但是,多波反射也可以提供有关晶体结构的信息,因为晶胞参数决定了多波峰的位置。测量了星云中的禁止反射002和100,并在此显示了一种基于半运动X射线散射的方法来处理多波干扰。
更新日期:2021-05-06
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