Various studies on multi-valued-logic (MVL) computing, which utilizes more than two logic states, have recently been resumed owing to the demand for greater power saving in the current logic technologies. In particular, unlike old-fashioned researches, extensive efforts have been focused on implementing single devices with multiple threshold voltages via a negative-differential current change phenomenon. In this work, we report a multiple negative-differential-transconductance (NDT) phenomenon, which is achieved through the control of partial gate potential and light power/wavelength in a van-der-Waals (vdW) multi-channel phototransistor. The partial gating formed a controllable potential barrier/well in the vdW channel, enabling control over the collection of carriers and eventually inducing the NDT phenomenon. Especially, the strategy shining lights with different powers/wavelengths facilitated the precise NDT control and the realization of the multiple NDT phenomenon. Finally, the usability of this multiple NDT device as a core device of MVL arithmetic circuits such as MVL inverters/NAND/NOR gates is demonstrated.

由于当前逻辑技术要求更大的功率节省，最近已经恢复了对利用两个以上逻辑状态的多值逻辑（MVL）计算的各种研究。特别是，与老式的研究不同，大量的精力集中在通过负微分电流变化现象实现具有多个阈值电压的单个器件上。在这项工作中，我们报告了多重负微分跨导（NDT）现象，这是通过控制范德华（vdW）多通道光电晶体管中的部分栅极电势和光功率/波长来实现的。部分门控在vdW通道中形成了可控的势垒/阱，从而可以控制载流子的收集并最终引发NDT现象。尤其，不同功率/波长的闪光策略有利于精确的无损检测控制和多种无损检测现象的实现。最后，说明了这种多重NDT器件作为MVL算术电路（例如MVL反相器/ NAND / NOR门）的核心器件的可用性。