In reliability research, electronic devices are an important part of our lives and modelling their lives is the most difficult and fascinating area. To investigate the failure functioning of electronic equipments, reliability monitoring of systems is widely used. However, it is stated in the literature that one in five electronic system collapses are a consequence of degradation and saving energy and forecasting future losses, it is necessary to summarize the data through certain versatile models of probability . In current article, a model of reliability formed on inverse power law and generalized inverse Weibull model is suggested. This current distribution presents a clearer framework to modelling the efficiency and functionality lifespan of electronic equipments. In this article, an empirical analysis is discussed related to life cycle of a surface-mounted electrolytic capacitor (SMEC). In addition, it has noticed that evaluation of suggested distribution varies from classical model of inverse Weibull and that influences average time to failure (ATTF) of the studied capacitor.

中文翻译：

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结合指数逆威布尔分布和逆幂律的可靠性分析

在可靠性研究中，电子设备是我们生活的重要组成部分，对其生活进行建模是最困难和最迷人的领域。为了调查电子设备的故障功能，系统的可靠性监控被广泛使用。然而，文献中指出五分之一的电子系统崩溃是退化和节能以及预测未来损失的结果，有必要通过某些通用的概率模型来总结数据。在本文中，提出了建立在逆幂律和广义逆威布尔模型上的可靠性模型。这种电流分布为模拟电子设备的效率和功能寿命提供了一个更清晰的框架。在本文中，讨论了与表面贴装电解电容器 (SMEC) 的生命周期相关的经验分析。此外，它注意到建议分布的评估与逆威布尔的经典模型不同，这会影响所研究电容器的平均故障时间 (ATTF)。