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The Coupled Wave Thickness Method as a Universal Method for Synthesizing Interference Antireflection Coatings ( $${\pi}$$ -Structures)
Moscow University Physics Bulletin ( IF 0.4 ) Pub Date : 2021-03-14 , DOI: 10.3103/s0027134920060119
A. V. Kozar

Abstract

A method is proposed and a universal algorithm is constructed on its basis. The algorithm includes a complete set of all structural solutions encountered in the synthesis of antireflection multilayer structures. Exact analytical relations are obtained that make it possible to synthesize antireflection structures with the minimum possible number of layers for any real values of the refractive indices of both matched media and materials of layers of such structures. Their structural and matching properties are analyzed and generalized. The correctness of the obtained exact solutions and the efficiency of the method are confirmed by a numerical experiment.

Keywords: multilayer structures, interference



中文翻译:

耦合波厚法作为合成抗反射涂层的通用方法($$ {\ pi} $$ -Structures)

摘要

提出了一种方法,并在此基础上构造了通用算法。该算法包括抗反射多层结构合成中遇到的所有结构解决方案的完整集合。获得精确的分析关系,使得对于匹配的介质和这种结构的层的材料的折射率的任何实际值,可以合成具有最小可能层数的抗反射结构。对它们的结构和匹配特性进行了分析和归纳。通过数值实验证实了所获得精确解的正确性和方法的有效性。

关键词:多层结构干涉

更新日期:2021-03-15
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