This issue is dedicated to the annual Hack@DAC competition, an event that has been annually held at the Design Automation Conference (DAC) since 2017. The best scoring teams of this security competition were invited to write articles for this IEEE Design&Test special issue. Many thanks to the guest editors Siddharth Garg, Daniel Holcomb, Jeyavijayan Rajendran, and Ahmad-Reza Sadeghi who are presenting four articles.

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From-the-EiC_38_1

这个问题是 自2017年以来，该活动每年都在设计自动化会议（DAC）上举行，该活动每年都致力于举办Hack @ DAC竞赛。该安全竞赛的最佳评分团队应邀为此撰写文章。 IEEE设计与测试特刊。非常感谢客座编辑Siddharth Garg，Daniel Holcomb，Jeyavijayan Rajendran和Ahmad-Reza Sadeghi的演讲，他们发表了四篇文章。