Physical Unclonable Functions (PUFs) are considered to be a promising technology that provides a hardware root-of-trust for integrated circuit (IC) applications. PUFs exploit the intrinsic process variations that map a set of challenges to a set of responses. The intrinsic process variations are caused by uncontrollable deviations in the IC manufacturing process, which are unique and random from die to die and wafer to wafer. As the PUF output is device-specific, PUFs can, therefore, be used in IC identification and authentication, and cryptographic key generation. Nevertheless, many different successful attack techniques have already revealed vulnerabilities in certain PUFs, including invasive, semi-invasive and noninvasive attacks. In this work, we survey some of the known attacks on PUFs. We also survey the countermeasures to these types of attack presented in recent literature, and finally, discuss the future challenges. Through this survey, the susceptibility of PUFs to attacks is highlighted and this information may be used to improve the quality of future PUF-based application designs.

中文翻译：

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PUF 对侵入性、半侵入性和非侵入性攻击的敏感性调查：未来方向的挑战和机遇

物理不可克隆函数 (PUF) 被认为是一种有前途的技术，可为集成电路 (IC) 应用程序提供硬件信任根。PUF 利用将一组挑战映射到一组响应的内在过程变化。固有的工艺变化是由 IC 制造过程中无法控制的偏差引起的，这些偏差在芯片与芯片和晶圆与晶圆之间是唯一且随机的。由于 PUF 输出是特定于设备的，因此 PUF 可用于 IC 识别和认证以及加密密钥生成。然而，许多不同的成功攻击技术已经揭示了某些 PUF 的漏洞，包括侵入性、半侵入性和非侵入性攻击。在这项工作中，我们调查了一些已知的对 PUF 的攻击。我们还调查了最近文献中提出的针对这些类型攻击的对策，最后讨论了未来的挑战。通过这项调查，PUF 对攻击的敏感性得到了强调，这些信息可用于提高未来基于 PUF 的应用程序设计的质量。