In a spacecraft, flip-flops take part in holding operational configuration for long durations. Single event transients (SETs) at control inputs of such flip-flops can culminate in single event upsets (SEUs). An SEU may cause loss of one or more mission objectives or service disruption or life reduction of the spacecraft. Many radiation-hardened-by-design (RHBD) circuits are presented in the literature to improve the reliability of control inputs of flip-flops. However, leaf nodes of these circuits interfaced with control inputs remain vulnerable to SETs. This article proposes two novel SET mitigation circuits with immune leaf nodes and demonstrates it through a few case studies. The proposed circuits improve SET hardness at control inputs of flip-flops by at least three times compared to unhardened inputs. Comparison of important parameters with the published SET mitigation approaches shows that the proposed circuits require lesser transistors and consume low power.

中文翻译：

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具有免疫叶节点的单事件瞬态（SET）缓解电路

在航天器中，触发器会长时间保持操作配置。这种触发器的控制输入端的单事件瞬变（SET）可能最终导致单事件翻转（SEU）。SEU可能会导致一个或多个任务目标的损失，服务中断或航天器寿命的缩短。文献中提出了许多设计辐射增强（RHBD）电路，以提高触发器控制输入的可靠性。但是，与控制输入接口的这些电路的叶节点仍然容易受到SET的攻击。本文提出了两个新颖的带有免疫叶结的SET缓解电路，并通过一些案例研究对其进行了证明。与未加硬的输入相比，所提出的电路将触发器控制输入处的SET硬度提高了至少三倍。