Thin films Mn1.5Co1Ni0.5O4 (MCNO), Mn1.5Co1Ni0.35Cu0.15O4 (MCNCuO) and Mn1.5Co1Ni0.2Cu0.15Sc0.15O4 (MCNCuScO) are prepared by Chemical Solution Deposition method. The results show that the addition of Cu and Cu/Sc elements can reduce the grain boundary energy and the grain boundary angle to improve the single crystal degree of MCNO thin film. Through the analysis of MCNCuScO thin film, it is found that the stability of spinel structure mainly depends on the octahedron rather than tetrahedron. The bandgap of the samples from small to large is separately MCNCuScO, MCNCuO and MCNO films. The absorptivity within the waveband of λ ≤ 1.5 μm plays a decisive role in the performance of the detector. At the same frequency, the MCNCuO thin film detector has the highest voltage responsivity, followed by the MCNCuScO thin film detector, while the MCNO film detector has the lowest responsivity.

中文翻译：

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含Cu和Cu/Sc元素的Mn-Co-Ni-O薄膜及探测器性能研究

薄膜锰1.5公司1你0.5○4(MCNO),锰1.5公司1你0.35铜0.15○4(MCNCuO) 和锰1.5公司1你0.2铜0.15Sc0.15○4(MCNCuScO) 是通过化学溶液沉积法制备的。结果表明，Cu和Cu/Sc元素的加入可以降低晶界能和晶界角，从而提高MCNO薄膜的单晶度。通过对MCNCuScO薄膜的分析发现，尖晶石结构的稳定性主要取决于八面体而非四面体。样品的带隙从小到大分别为MCNCuScO、MCNCuO和MCNO薄膜。波段内的吸收率λ ≤ 1.5 μ米对探测器的性能起着决定性的作用。在相同频率下，MCNCuO薄膜探测器的电压响应度最高，其次是MCNCuScO薄膜探测器，而MCNO薄膜探测器的响应度最低。