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Enhanced thermoelectric performance of Bi0.5Sb1.5Te3 via Ni-doping: A Shift of peak ZT at elevated temperature via suppressing intrinsic excitation
Journal of Materiomics ( IF 8.4 ) Pub Date : 2021-03-08 , DOI: 10.1016/j.jmat.2021.03.003
Sahiba Bano , D.K. Misra , J.S. Tawale , Sushil Auluck

Bi2Te3-based thermoelectric (TE) materials have been demonstrated to be a potential candidate for mainly thermoelectric cooling/refrigeration applications. However, minority charge carriers excitation at high temperature reduces thermopower which restricts these materials for the use in power generation. In present work, substitution of Ni on Sb site in Bi0.5Sb1.5-xNixTe3 (x = 0, 0.01, 0.04 and 0.08) actuates the system to supress the intrinsic excitation leading to shift in highest ZT to higher temperature regime. The Density functional theory (DFT) calculations and experimental results reveal that Ni in Bi0.5Sb1.5Te3 provides the extra holes and slightly reduces the band gap Eg which enhances the σ of Ni-doped Bi0.5Sb1.5-xNixTe3 samples and α at elevated temperature. Moreover, Ni-doping in Bi0.5Sb1.5Te3 also reduces κL which is attributed to the phonon scattering due to mass fluctuations and microstructural features such as grain boundary and strain field domain observed from HRTEM investigation. These favourable condition leads to maximum ZT∼1.38 at 433K for Bi0.5Sb1.46Ni0.04Te3 and ZTavg ∼1.1 between 300K and 503K. Interestingly the calculated theoretical TE conversion device efficiency η of Bi0.5Sb1.46Ni0.04Te3 (η∼5.5%) was achieved to be nearly twice than the efficiency of matrix Bi0.5Sb1.5Te3 (η∼3%). Experimental electronic transport is well corroborated with theoretically estimated DFT results.



中文翻译:

通过 Ni 掺杂增强 Bi0.5Sb1.5Te3 的热电性能:通过抑制本征激发在升高的温度下 ZT 峰值的偏移

Bi 2 Te 3基热电(TE)材料已被证明是主要用于热电冷却/制冷应用的潜在候选材料。然而,少数电荷载流子在高温下的激发会降低热电势,这限制了这些材料在发电中的使用。在目前的工作中,在 Bi 0.5 Sb 1.5-x Ni x Te 3 (x = 0, 0.01, 0.04 和 0.08) 中取代 Sb 位点上的 Ni 会驱动系统抑制固有激发,从而导致最高 ZT 转移到更高温度状态. 密度泛函理论 (DFT) 计算和实验结果表明,Ni 在 Bi 0.5 Sb 1.5 Te 3提供额外的孔并略微降低带隙 E g,这增强了 Ni 掺杂的 Bi 0.5 Sb 1.5-x Ni x Te 3样品的σ和高温下的α。此外,在 Bi 0.5 Sb 1.5 Te 3 中掺杂 Ni还降低了 κ L,这归因于由于质量波动和从 HRTEM 研究中观察到的晶界和应变场域等微观结构特征引起的声子散射。这些有利条件导致 Bi 0.5 Sb 1.46 Ni 0.04 Te 3和 ZT avg在 433K 时的最大 ZT∼1.38∼1.1 在 300K 和 503K 之间。有趣的是,计算出的 Bi 0.5 Sb 1.46 Ni 0.04 Te 3 (η~5.5%) 的理论 TE 转换装置效率 η几乎是基体 Bi 0.5 Sb 1.5 Te 3 (η~ 3 %)效率的两倍。实验电子传输与理论上估计的 DFT 结果得到了很好的证实。

更新日期:2021-03-08
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