The origin and thermal stability of charge trapping centers were studied in Li₂MoO₄ cryogenic scintillators by correlated electron paramagnetic resonance (EPR) and thermally stimulated luminescence (TSL) measurements. Up to five electron and three hole trapping centers were detected in the crystals X-ray irradiated at 77 K. The electron traps were ascribed to MoO₄³⁻ molecular complexes, unperturbed and perturbed by neighboring defects, while the hole traps – to O⁻ lattice ions perturbed by lithium and molybdenum vacancies. The thermal stability of the trapping centers was studied and the depths of electron and hole traps were determined. The TSL peaks observed in the 77–300 K temperature range were related to the depletion of the detected paramagnetic centers. Influence of the revealed centers on the scintillation light yield is discussed.

通过相关电子顺磁共振（EPR）和热激发发光（TSL）测量，研究了Li ₂ MoO ₄低温闪烁体中电荷俘获中心的起源和热稳定性。多达五个电子和三个油孔俘获中心在X射线照射的晶体检测在77K的电子陷阱被归因于的MoO ₄ ^3-分子复合物，未扰动的扰动和由相邻缺陷，而空穴陷阱-至O ^-锂和钼空位扰动的晶格离子。研究了陷阱中心的热稳定性，并确定了电子陷阱和空穴陷阱的深度。在77–300 K的温度范围内观察到的TSL峰与检测到的顺磁中心的耗尽有关。讨论了所揭示的中心对闪烁光产量的影响。