Operando observation using spin-polarized scanning electron microscopy (spin SEM) has been demonstrated by detecting changes in the magnetization in the writing head of a hard disk drive (HDD) during operation. A current-applying system developed for use in the sample stage of a spin SEM enables imaging of the magnetization changes in the writing head of an HDD while the writing head is activated. Focused ion beam (FIB) technology is used to fabricate electric contacts between the head terminals and the sample holder electrodes. Tungsten film is deposited by FIB technology on the insulator around the writing head to prevent electrostatic charge buildup in the insulators during SEM measurement. This system is well suited for studying the characteristics of writing heads in HDDs in an activated state.

中文翻译：

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利用自旋极化扫描电子显微镜观察 HDD 写入磁头中的磁性

使用自旋极化扫描电子显微镜 (spin SEM) 的 Operando 观察已通过检测硬盘驱动器 (HDD) 的写入头在操作期间的磁化变化来证明。为在旋转 SEM 的样品阶段使用而开发的电流施加系统能够在写入头被激活时对 HDD 的写入头中的磁化变化进行成像。聚焦离子束 (FIB) 技术用于制造头部端子和样品架电极之间的电接触。钨膜通过 FIB 技术沉积在写头周围的绝缘体上，以防止在 SEM 测量期间在绝缘体中积聚静电电荷。该系统非常适合研究处于激活状态的 HDD 中写入头的特性。