An experimental technique that allows faster assessment of out-of-plane strain dynamics of thin film heterostructures via x-ray diffraction is presented. In contrast to conventional high-speed reciprocal space-mapping setups, our approach reduces the measurement time drastically due to a fixed measurement geometry with a position-sensitive detector. This means that neither the incident (ω) nor the exit ($2\theta$) diffraction angle is scanned during the strain assessment via x-ray diffraction. Shifts of diffraction peaks on the fixed x-ray area detector originate from an out-of-plane strain within the sample. Quantitative strain assessment requires the determination of a factor relating the observed shift to the change in the reciprocal lattice vector. The factor depends only on the widths of the peak along certain directions in reciprocal space, the diffraction angle of the studied reflection, and the resolution of the instrumental setup. We provide a full theoretical explanation and exemplify the concept with picosecond strain dynamics of a thin layer of NbO₂.

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倒数空间切片：飞秒X射线衍射的省时方法

提出了一种实验技术，可以通过X射线衍射更快地评估薄膜异质结构的面外应变动力学。与传统的高速对等空间映射设置相反，我们的方法由于具有位置敏感检测器的固定测量几何形状而大大减少了测量时间。这意味着入射角（ω）或出口（（$\mathrm{2个}\theta$）在应变评估过程中通过X射线衍射扫描衍射角。固定X射线区域检测器上衍射峰的移动源自样品内的平面外应变。定量应变评估需要确定将观察到的位移与倒易晶格矢量变化相关的因子。该因子仅取决于互易空间中沿某些方向的峰的宽度，所研究反射的衍射角以及仪器设置的分辨率。我们提供了完整的理论解释，并用皮秒NbO ₂薄层的应变动力学来举例说明这一概念。