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Operando Study of Thermal Oxidation of Monolayer MoS2
Advanced Science ( IF 14.3 ) Pub Date : 2021-03-01 , DOI: 10.1002/advs.202002768
Sangwook Park 1, 2 , Angel T Garcia-Esparza 1, 3 , Hadi Abroshan 4, 5 , Baxter Abraham 3, 6 , John Vinson 7 , Alessandro Gallo 4 , Dennis Nordlund 3 , Joonsuk Park 8 , Taeho Roy Kim 9 , Lauren Vallez 1 , Roberto Alonso-Mori 6 , Dimosthenis Sokaras 3 , Xiaolin Zheng 1
Affiliation  

Monolayer MoS2 is a promising semiconductor to overcome the physical dimension limits of microelectronic devices. Understanding the thermochemical stability of MoS2 is essential since these devices generate heat and are susceptible to oxidative environments. Herein, the promoting effect of molybdenum oxides (MoOx) particles on the thermal oxidation of MoS2 monolayers is shown by employing operando X‐ray absorption spectroscopy, ex situ scanning electron microscopy and X‐ray photoelectron spectroscopy. The study demonstrates that chemical vapor deposition‐grown MoS2 monolayers contain intrinsic MoOx and are quickly oxidized at 100 °C (3 vol% O2/He), in contrast to previously reported oxidation thresholds (e.g., 250 °C, t ≤ 1 h in the air). Otherwise, removing MoOx increases the thermal oxidation onset temperature of monolayer MoS2 to 300 °C. These results indicate that MoOx promote oxidation. An oxide‐free lattice is critical to the long‐term stability of monolayer MoS2 in state‐of‐the‐art 2D electronic, optical, and catalytic applications.

中文翻译:

单层MoS2热氧化的操作研究

单层MoS 2是一种很有前景的半导体,可以克服微电子器件的物理尺寸限制。了解 MoS 2的热化学稳定性至关重要,因为这些设备会产生热量并且容易受到氧化环境的影响。在此,通过原位X射线吸收光谱、异位扫描电子显微镜和X射线光电子能谱显示了氧化钼(MoO x )颗粒对MoS 2单层热氧化的促进作用。研究表明,化学气相沉积法生长的 MoS 2单层含有固有的 MoO x ,并且在 100 °C (3 vol% O 2 /He)下快速​​氧化,这与之前报道的氧化阈值(例如 250 °C,t ≤空气中 1 小时)。否则,去除MoO x会将单层MoS 2的热氧化起始温度提高至300℃。这些结果表明MoO x促进氧化。无氧化物晶格对于单层 MoS 2在最先进的二维电子、光学和催化应用中的长期稳定性至关重要。
更新日期:2021-05-05
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