Scanning quantum dot microscopy is a recently developed high-resolution microscopy technique that is based on atomic force microscopy and is capable of imaging the electrostatic potential of nanostructures like molecules or single atoms. Recently, it could be shown that it not only yields qualitatively but also quantitatively cutting edge images even on an atomic level. In this paper we present how control is a key enabling element to this. The developed control approach consists of a two-degree-of-freedom control framework that comprises a feedforward and a feedback part. For the latter we design two tailored feedback controllers. The feedforward part generates a reference for the current scanned line based on the previously scanned one. We discuss in detail various aspects of the presented control approach and its implications for scanning quantum dot microscopy. We evaluate the influence of the feedforward part and compare the two proposed feedback controllers. The proposed control algorithms speed up scanning quantum dot microscopy by more than a magnitude and enable to scan large sample areas.

中文翻译：

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扫描量子点显微镜的控制

扫描量子点显微镜是一种最新开发的高分辨率显微镜技术，它基于原子力显微镜，能够对诸如分子或单个原子的纳米结构的静电势进行成像。最近，可以证明，它不仅可以定性地产生图像，而且甚至可以在原子水平上定量地显示边缘图像。在本文中，我们介绍了控制是如何使其成为关键要素的。所开发的控制方法由两自由度控制框架组成，该框架包含前馈和反馈部分。对于后者，我们设计了两个定制的反馈控制器。前馈部分根据先前扫描的行为当前扫描的行生成参考。我们将详细讨论所提出的控制方法的各个方面及其对扫描量子点显微镜的影响。我们评估前馈部分的影响，并比较两个建议的反馈控制器。所提出的控制算法将扫描量子点显微技术的扫描速度提高了一个数量级以上，并能够扫描较大的样品区域。