Defect characterization by deep level transient spectroscopy (DLTS) requires the extraction of two key quantities of the carrier emission rate from the defects—activation energy (E_a) and pre-exponential factor (ν₀)—the latter is related to the carrier capture cross section. This task, ubiquitous to thermally activated processes besides defect–carrier interaction, is traditionally accomplished by constructing an Arrhenius plot with DLTS peak locations and fitting it with a line. We present a transformation method based on the Arrhenius equation that extracts E_a and ν₀ without constructing or line-fitting the Arrhenius plot and bypasses peak identification. This method is developed on the basis of the fundamental temperature-rate duality relationship and extracts E_a and ν₀ by matching the curvatures the Arrhenius-transformed spectra of the iso-thermal and iso-rate DLTS scans in the 2D temperature-rate plane. The extraction can be conducted with data in a small temperature range and is, therefore, capable of unambiguously resolving E_a and ν₀ at any temperature point and their temperature dependence, if any.

中文翻译：

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没有Arrhenius图的深层瞬态光谱表征

通过深能级瞬态谱（DLTS）缺陷表征需要载流子发射率的两个关键量的从缺陷-活化能萃取（Ë_一个）和预指数因子（ν ₀）-the后者相关的载流子捕获横截面。传统上，此任务除了通过缺陷-载体相互作用之外，还普遍存在于热激活过程中，该任务是通过构建具有DLTS峰位置的Arrhenius图并将其与直线拟合来完成的。我们提出了基于Arrhenius方程的变换方法提取Ë_一个和ν ₀ 无需构建或线拟合的Arrhenius图并绕过峰识别。此方法的基本温度速率对偶关系的基础上发展起来的，并提取Ë_一个和ν ₀通过匹配的曲率在2D温度率平面上的异热和异速率DLTS扫描的阿列纽斯变换光谱。提取可以用数据在小的温度范围内进行，并且因此，能够明确地分辨的Ë_一个和ν ₀在任何温度点和它们的温度依赖性，如果有的话。