We report the creation of Ge₂Sb₂Te₅ metasurfaces on sapphire substrates by the ablation method and the study of their structural properties by scanning electron microscopy (SEM), atomic force microscopy (AFM), and optical diffraction. The main emphasis is on the optical technique, which boils down to obtaining bright Laue diffraction patterns on a screen, observing them with the naked eye, and analyzing the fine structure of diffraction reflections. It has been demonstrated that in one simple optical experiment it is possible to assess the quality of fabricated metasurfaces, determine the structure symmetry, and, moreover, determine the number of structural elements and lattice constants of the micron-sized metasurface. The accuracy of the optical technique is confirmed by comparison with the results of studies by SEM and AFM methods.

我们报告了Ge ₂ Sb ₂ Te _5的产生烧蚀法在蓝宝石衬底上形成超微表面，并通过扫描电子显微镜（SEM），原子力显微镜（AFM）和光学衍射研究其结构特性。主要重点是光学技术，其归结为在屏幕上获得明亮的劳厄衍射图样，用肉眼观察它们，并分析衍射反射的精细结构。已经证明，在一个简单的光学实验中，可以评估所制造的超颖表面的质量，确定结构的对称性，并且还能确定微米级超颖表面的结构元素的数量和晶格常数。通过与SEM和AFM方法的研究结果进行比较，可以确认光学技术的准确性。