Strong multiple Bragg reflections (MBRs) which can be realized in a bent-perfect-crystal (BPC) slab provide a monochromatic beam of excellent resolution parameters. For identifying MBR effects in the BPC Si crystal, we used the method of azimuthal rotation of the crystal lattice around the scattering vector of the primary forbidden Si(200) reflection for a fixed chosen wavelength. In this paper, several azimuthal scans searching strong MBR effects with the intention of a possible practical exploitation for very high-resolution diffractometry are presented.

中文翻译：

---

观察弯曲完美 Si 晶体中伴随禁止 Si(002) 反射的多次布拉格反射

可以在弯曲完美晶体 (BPC) 平板中实现的强多次布拉格反射 (MBR) 提供了具有出色分辨率参数的单色光束。为了识别 BPC Si 晶体中的 MBR 效应，我们使用了晶格围绕固定选择波长的初级禁止 Si(200) 反射的散射矢量进行方位角旋转的方法。在本文中，提出了几个搜索强 MBR 效应的方位角扫描，目的是对非常高分辨率的衍射测量进行实际开发。