In this study, L_α/L_β1 and L_α/L_β2 X-ray intensity ratios for gadolinium, dysprosium and erbium elements were experimentally determined. L X-ray intensity ratio measurements were gauged at several temperatures (50, 100, 50, 150, 200, 250, 300, 350 and 400 °C) using an excitation energy of 59.54 keV γ-rays emitted from a 100 mCi ²⁴¹Am radioactive source. L X-ray emission spectra were detected using a Si (Li) detector system with a resolution of 160 eV at 5.96 keV coupled with a computer-controlled multi-channel analyzer. L X-ray production cross-sections (σ_Lα, σ_Lβ1 and σ_Lβ2) of the lanthanide elements were calculated by assessing the emission spectra. The variation with temperature of each parameter was given in graphical forms and tabulated. It was observed that the parameters were affected by temperature. According to these results, it is determined that the L X-ray intensity ratios and L X-ray production cross-sections of pure Gd, Dy and Er elements changed and were affected by temperature.

在这项研究中，实验确定了L 、,和and元素的_Lα / _Lβ1和_Lα / _Lβ2X射线强度比。使用从100 mCi ²⁴¹ Am发出的59.54 keVγ射线激发能在几个温度下（50、100、50、150、200、250、300、350和400°C）测量L X射线强度比测量值放射源。使用Si（Li）检测器系统检测L X射线发射光谱，该系统的分辨率为5.96 keV，分辨率为160 eV，并配有计算机控制的多通道分析仪。L X射线产生的横截面（σ _Lα，σ _Lβ1和σ _Lβ2通过评估发射光谱计算镧系元素。每个参数随温度的变化以图形形式给出并制成表格。观察到参数受温度影响。根据这些结果，确定纯Gd，Dy和Er元素的L X射线强度比和L X射线产生横截面改变并且受温度影响。