The knowledge of the spectroscopic parameters of the elemental emission lines is important for diagnostics of laser-induced plasmas and the application of calibration-free/fundamental parameters analytical methods. In this paper, we used the recently proposed Time-Independent Extended C-Sigma (TIECS) method for determining, for the first time, the transition probabilities and Stark broadening coefficients of several neutral and ionic silver emission lines. The method allows for a compensation of self-absorption in the plasma, thus providing a measure of the spectroscopic parameters which is not affected by the optical thickness of the plasma.

中文翻译：

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使用时间独立的扩展C-Sigma方法确定Ag（I）和Ag（II）发射谱线的光谱参数

元素发射谱线的光谱参数知识对于激光诱导等离子体的诊断以及免校准/基本参数分析方法的应用非常重要。在本文中，我们首次使用了最近提出的与时间无关的扩展C-Sigma（TIECS）方法来确定多个中性和离子型银发射线的跃迁概率和Stark加宽系数。该方法允许补偿等离子体中的自吸收，从而提供不受光谱的光学厚度影响的光谱参数的量度。