We report on a feasibility study of using Raman micro-spectroscopy as a characterization method for quality control of (REBCO, rare-earth barium copper oxide) coated conductors (CC). Fragments of long REBCO tape deposited using advanced metal organic chemical vapor deposition with dropouts in critical current (I _c) were analyzed implementing Raman spectroscopy in area scan (map) and linear scan modes, in order to evaluate the level of information obtainable with the technique. The areal maps have been found to provide detailed information on the spatial distribution of the sample quality, providing maps of both intensity and wavelength shift characteristic of Raman-active peaks. The maps readily identify defective regions ranging from completely misoriented a-axis domains (REBCO a-axis || sample normal), as well as regions with well-textured c-axis orientation (REBCO c-axis || sample normal) but with significant variation in cation disorder. The results are complemented with linear scans carried out by two-dimensional x-ray diffraction, which do identify the a-axis grain regions but do not detect any apparent anomaly in the cation-disordered region detected by Raman micro-spectroscopy. The results indicate that scanning Raman spectroscopy has the potential to be utilized as a fast, insightful, and reliable characterization, quality, and process control technique for both CC optimization and increase of manufacturing yield.

我们报告了使用拉曼显微光谱作为（REBCO，稀土钡铜氧化物）涂层导体（CC）质量控制的表征方法的可行性研究。使用拉曼光谱在区域扫描（图）和线性扫描模式下分析了使用先进的金属有机化学气相沉积法沉积的长REBCO磁带的片段，并在临界电流（I _c）下进行了分析，以评估该技术可获得的信息水平。已经发现这些面积图提供了有关样品质量的空间分布的详细信息，提供了拉曼活性峰的强度和波长漂移特性的图。这些图很容易识别出缺陷区域，范围从完全错位的a-轴域（REBCO a轴||样本法线），以及具有良好纹理的c轴方向（REBCO c轴||样本法线）但阳离子障碍显着变化的区域。通过二维X射线衍射进行的线性扫描对结果进行了补充，该扫描确实确定了a轴晶粒区域，但未检测到由拉曼显微光谱检测到的阳离子无序区域中的任何明显异常。结果表明，扫描拉曼光谱法有可能被用作快速，有洞察力和可靠的表征，质量和过程控制技术，以用于CC优化和提高生产良率。