Radiation damage induced in Zircaloy-4 by 20 MeV Au ions was investigated using Grazing x-ray diffraction (GIXRD), positron annihilation techniques, micro-and nano-hardness techniques. The irradiations were performed at room temperature in the fluence range 1נ10¹³–5נ10¹⁴ ions cm⁻² corresponding to 0.07–3.63 displacements per atom (dpa). The grazing incidence angle x-ray diffraction (GIXRD) revealed the presence of the hydride precipitates in the analyzed zircaloy-4. According to our experimental data it is found that the amount of these precipitates decreases after irradiation as emphasized by GIXRD and Positron Annihilation Lifetime Spectroscopy (PALS) results. The same data revealed also a zircaloy-4 swelling above a certain dose. From the combination of domain size/microstrain with the micro- and nano-hardness results, we conclude that the Zircaloy hardening is mainly due to the dislocation formation indicating the effect of the microstructure on the mechanical properties. Moreover, from the dose dependence of irradiation hardening we conclude that the transition point from low-dose to high-dose regime is observed around 0.07 dpa.

使用掠射X射线衍射（GIXRD），正电子induced没技术，显微和纳米硬度技术研究了20 MeV Au离子在Zircaloy-4中引起的辐射损伤。辐照是在室温下在1×10 ¹³ –5 × 10 ¹⁴离子cm ^-2的注量范围内进行的。对应于每原子0.07–3.63位移（dpa）。掠入射角X射线衍射（GIXRD）显示，在分析的Zircaloy-4中存在氢化物沉淀。根据我们的实验数据，发现通过GIXRD和正电子An灭寿命光谱（PALS）结果可以看出，辐射后这些沉淀物的数量减少了。相同的数据还显示，zircaloy-4在一定剂量以上会溶胀。从畴尺寸/微应变与显微硬度和纳米硬度的结果相结合，我们得出结论，Zircaloy硬化主要归因于位错的形成，表明了显微组织对机械性能的影响。而且，