An on-chip noise monitor using a dual-mode analog to digital converter (ADC) is developed to detect the insertion of off-chip components as malicious attempts of power noise measurement attacks. A two-step sampling scheme selecting either synchronous or asynchronous clocking enables both real-time monitoring and high-resolution diagnosis of power supply noise, respectively. The monitor detects the change in power-line impedance and assumes the happening of physical contacts by an attacker’s device. A wide-band ADC with the bandwidth of 1GHz facilitates the analysis of on-chip captured waveforms and the recognition of potentially inserted devices. Fabricated in 65nm CMOS, the on-chip noise monitor is examined for the detectability of series resistors as well as parallel capacitors that are intentionally inserted on power lines. The experiments demonstrated the detection of a power current sensor in series to power lines, and also the attachment of an oscilloscope probe, through the analysis of on-chip captured power noise waveforms.

开发了一种使用双模式模数转换器（ADC）的片上噪声监控器，以检测芯片外组件的插入，作为对功率噪声测量攻击的恶意尝试。通过选择同步或异步时钟的两步采样方案，可以分别实时监控电源噪声并进行高分辨率诊断。监视器检测到电源线阻抗的变化，并假定攻击者的设备发生了物理接触。带宽为1GHz的宽带ADC有助于分析片上捕获的波形以及识别潜在插入的设备。片上噪声监测器采用65nm CMOS制成，检查了故意插入电源线的串联电阻以及并联电容器的可检测性。