Current X-ray imaging technologies involving flat-panel detectors have difficulty in imaging three-dimensional objects because fabrication of large-area, flexible, silicon-based photodetectors on highly curved surfaces remains a challenge^1,2,3. Here we demonstrate ultralong-lived X-ray trapping for flat-panel-free, high-resolution, three-dimensional imaging using a series of solution-processable, lanthanide-doped nanoscintillators. Corroborated by quantum mechanical simulations of defect formation and electronic structures, our experimental characterizations reveal that slow hopping of trapped electrons due to radiation-triggered anionic migration in host lattices can induce more than 30 days of persistent radioluminescence. We further demonstrate X-ray luminescence extension imaging with resolution greater than 20 line pairs per millimetre and optical memory longer than 15 days. These findings provide insight into mechanisms underlying X-ray energy conversion through enduring electron trapping and offer a paradigm to motivate future research in wearable X-ray detectors for patient-centred radiography and mammography, imaging-guided therapeutics, high-energy physics and deep learning in radiology.

当前涉及平板探测器的 X 射线成像技术难以对三维物体进行成像，因为在高度弯曲的表面上制造大面积、灵活的硅基光电探测器仍然是一个挑战^1,2,3. 在这里，我们使用一系列可溶液加工的镧系元素掺杂纳米闪烁体展示了用于无平板、高分辨率、3D 成像的超长寿命 X 射线捕获。通过缺陷形成和电子结构的量子力学模拟证实，我们的实验表征表明，由于主晶格中辐射触发的阴离子迁移导致被捕获电子的缓慢跳跃可以诱导超过 30 天的持续放射发光。我们进一步展示了 X 射线发光扩展成像，其分辨率大于每毫米 20 线对，光学记忆时间超过 15 天。