An analysis was performed for examining the consequences of sample deformation in longitudinal axis in the sample-loaded non-resonant waveguide techniques. Vertical and horizontal deformations were first simulated to understand the change in field distributions and corresponding scattering parameters. Then, effects of sample length, dielectric constant, and loss factor for these deformations on extracted electromagnetic properties were analyzed using simulated results. Finally, S-parameter measurements were carried out to understand the effect of vertical deformation on permittivity results and to examine any improper sample preparation by hand-made and machine-made samples by applying a statistical model based on mean, standard deviation, coefficient of variation, and confidence interval. It was noted that extracted dielectric constants of each tested dielectric sample (polyethylene, polypropylene, polyvinyl-chloride) were within the confidence interval range of 90% while their retrieved loss factors were within the confidence interval range of 90%, 95%, or 98%.

进行了分析，以检查样品加载的非谐振波导技术中样品在纵轴上变形的后果。首先模拟垂直和水平变形，以了解场分布和相应散射参数的变化。然后，使用模拟结果分析了样品长度，介电常数和这些变形的损耗因子对提取的电磁性能的影响。最后，进行S参数测量，以了解垂直形变对介电常数结果的影响，并通过应用基于均值，标准差，变异系数的统计模型来检查手工和机械样品的任何不当样品制备和置信区间。