In this study, doped thin cadmium peroxide films were prepared by pulsed laser deposition with different doping concentrations of aluminium of 0.0, 0.1, 0.3, and 0.5 wt.% for CdO_2(1-X)Al_(X) and thicknesses in the range of 200 nm. XRD patterns suggest the presence of cubic CdO₂ and the texture factor confirms that the (111) plane was the preferential growth plane, where the texture factor and the grain size decreased from 2.02 to 9.75 nm, respectively, in the pure sample to 1.88 and 5.65 nm, respectively, at a concentration of 0.5 wt%. For the predominant growth plane, the deviation of the diffraction angle Δθ and interplanar distance Δd from the standard magnitudes was 2.774° and 0.318 Å, respectively, for the pure sample decreased to − 2.633° and 0.301 Å for the largest doping concentration. The optical absorption was found to decrease with increasing doping concentration, where the changes in threshold wavelengths from the standard λ = 496 nm were blue shifted by Δλ = 142, 133, 128, and 152 nm, respectively, for the concentrations used. The occurrence of such blue shifts points to a widening of the band gap to Eg = 3.5, 3.4, 3.35, and 3.6 eV for concentrations of 0.0, 0.1, 0.3, and 0.5 wt%, respectively.

在这项研究中，通过脉冲激光沉积制备了掺杂的过氧化镉薄膜，其中CdO _2（1-X） Al _（X）的铝的掺杂浓度分别为0.0、0.1、0.3和0.5 wt。％，且厚度范围为200纳米 X射线衍射图表明存在立方CdO ₂，并且纹理因子证实（111）平面是优先生长平面，其中纯样品中的纹理因子和晶粒尺寸分别从2.02减小到9.75 nm，分别为1.88和1.88。浓度为0.5 wt％时分别为5.65 nm。对于主要的生长平面，衍射角的偏差Δθ对于纯样品，与标准量的平面间距Δd分别为2.774°和0.318Å，对于最大掺杂浓度，平面间距Δd降至-2.633°和0.301Å。的光吸收，发现随着掺杂浓度，其中从标准阈值的波长的变化以降低λ  = 496纳米的是蓝色的由Δ偏移λ  = 142，133，128，和152纳米，分别为使用的浓度。这种蓝移的出现表明对于0.0、0.1、0.3和0.5wt％的浓度，带隙分别扩大到Eg = 3.5、3.4、3.35和3.6eV。