This letter proposed a combined susceptibility diagram, applicable to investigating and differentiating the inherent mechanism of multipactor in dielectric-loaded microwave devices. This susceptibility diagram consists of average secondary emission yield on the dielectric surface and both the surfaces. Using this diagram, we predict the electron multiplication mechanism in the partially dielectric-loaded parallel-plate waveguide. It is found that the multipactor extinguishing only occurs for a low multipaction rate, while the saturation occurs for a higher multipaction rate. To verify its validity, the dynamic evolution of multipactor is investigated by electrostatic particle-in-cell. A good agreement between simulations and prediction results has been achieved. This susceptibility diagram thus constructed can provide a guidance to clearly identify the condition for multipactor extinguishing or saturation.

中文翻译：

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包括电介质表面平均二次发射率的组合磁化率图


这封信提出了一种组合磁化率图，适用于研究和区分介电负载微波器件中多极器的固有机制。该磁化率图由电介质表面和两个表面上的平均二次发射率组成。使用该图，我们预测了部分电介质加载的平行板波导中的电子倍增机制。研究发现，只有在低倍频率下才会发生倍频熄灭，而在较高频频率下会发生饱和。为了验证其有效性，通过静电细胞内粒子研究了多因子的动态演化。模拟和预测结果之间取得了良好的一致性。由此构建的磁化率图可以为清楚地识别多因子熄灭或饱和条件提供指导。