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Influence of Cu‐Doping on Linear and Nonlinear Optical Properties of High‐Quality ZnO Thin Films Obtained by Spin‐Coating Technique
Physica Status Solidi (B) - Basic Solid State Physics ( IF 1.5 ) Pub Date : 2021-02-09 , DOI: 10.1002/pssb.202000472 Abdelkader Mohammedi 1, 2 , Miloud Ibrir 1, 2 , Omar Meglali 2, 3 , Saadi Berri 2
Physica Status Solidi (B) - Basic Solid State Physics ( IF 1.5 ) Pub Date : 2021-02-09 , DOI: 10.1002/pssb.202000472 Abdelkader Mohammedi 1, 2 , Miloud Ibrir 1, 2 , Omar Meglali 2, 3 , Saadi Berri 2
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To study the effect of Cu concentration on morphological, structural, linear and nonlinear optical properties, copper‐doped ZnO thin films are grown by sol–gel/spin‐coating technique on the glass substrates. Scanning electron microscopy (SEM) images reveal that the surface morphology is homogeneous with good adhesion to the glass substrate. The energy dispersive X‐ray spectroscopy (EDS) spectra confirm that Zn, O, and Cu elements are present in ZnO films. The X‐ray diffraction (XRD) pattern of Cu‐doped ZnO is dominated by (002) peak, indicating an upstanding ZnO nanorods array growing along the c‐axis. The optical bandgap of Cu‐doped ZnO thin films, calculated from optical transmission spectra, is found to decrease with the increase in copper concentration. The refractive index dispersion curve of ZnO films is subjected to the single‐oscillator model. The optical dispersion parameters Eo, Ed, and n∞, the nonlinear refractive index, and nonlinear optical susceptibility are calculated and interpreted.
中文翻译：
铜掺杂对通过旋涂技术获得的高质量ZnO薄膜线性和非线性光学性能的影响
为了研究铜浓度对形态，结构，线性和非线性光学性质的影响，通过溶胶-凝胶/旋涂技术在玻璃基板上生长了掺铜的ZnO薄膜。扫描电子显微镜（SEM）图像显示，表面形态是均匀的，对玻璃基板的附着力很好。能量色散X射线光谱（EDS）光谱证实ZnO膜中存在Zn，O和Cu元素。掺杂Cu的ZnO的X射线衍射（XRD）图谱以（002）峰为主，表明沿c方向生长的直立ZnO纳米棒阵列-轴。由铜的ZnO薄膜的光学带隙，通过光学透射光谱计算，发现随着铜浓度的增加而减小。ZnO薄膜的折射率色散曲线受单振子模型的影响。所述光色散参数ë Ò，ë d，和Ñ ∞，非线性折射率，和非线性光学易感性被计算和解释。
更新日期：2021-02-09
中文翻译：
铜掺杂对通过旋涂技术获得的高质量ZnO薄膜线性和非线性光学性能的影响
为了研究铜浓度对形态，结构，线性和非线性光学性质的影响，通过溶胶-凝胶/旋涂技术在玻璃基板上生长了掺铜的ZnO薄膜。扫描电子显微镜（SEM）图像显示，表面形态是均匀的，对玻璃基板的附着力很好。能量色散X射线光谱（EDS）光谱证实ZnO膜中存在Zn，O和Cu元素。掺杂Cu的ZnO的X射线衍射（XRD）图谱以（002）峰为主，表明沿c方向生长的直立ZnO纳米棒阵列-轴。由铜的ZnO薄膜的光学带隙，通过光学透射光谱计算，发现随着铜浓度的增加而减小。ZnO薄膜的折射率色散曲线受单振子模型的影响。所述光色散参数ë Ò，ë d，和Ñ ∞，非线性折射率，和非线性光学易感性被计算和解释。
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