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IEEE Instrumentation & Measurement Magazine ( IF 1.6 ) Pub Date : 2021-02-02 , DOI: 10.1109/mim.2021.9345599
Robert M. Goldberg

Tektronix, Inc. has released the new Keithley S530 Series Parametric Test System with KTE 7 software and other enhancements. The S530 platform enables semiconductor fabs to add parametric test capacity for high-growth new technologies while minimizing CAPEX investment and maximizing wafers per hour efficiency. This reduced overall cost of ownership profile helps manufactures meet aggressive price pressures in competitive new markets.

中文翻译:

新产品

泰克公司已经发布了带有KTE 7软件和其他增强功能的新型吉时利S530系列参数测试系统。S530平台使半导体制造厂能够为高速增长的新技术增加参数测试能力,同时最大程度地减少CAPEX投资并最大程度提高每小时晶圆产量。这样降低了总体拥有成本,有助于制造商应对竞争激烈的新市场中的巨大价格压力。
更新日期:2021-02-05
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