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Magnetic anisotropy and magnetization reversal in cobalt-iron thin film
Spectroscopy Letters ( IF 1.7 ) Pub Date : 2021-02-04 , DOI: 10.1080/00387010.2021.1881129
Maheswari Mohanta 1 , Santosh K. Parida 1 , Ananya Sahoo 1 , Mukul Gupta 2 , Venkata Rama Rao Medicherla 1
Affiliation  

Abstract

Cobalt-iron thin film was deposited on rotating silicon (100) substrate using the DC-magnetron sputtering deposition unit. The structure is examined by Grazing Incidence X-ray Diffraction and results reveal that the sample has a bcc crystal structure with lattice constant 2.65 Å. The X-ray Reflectivity data analysis confirms that the thickness of the thin film alloy is about 33 nm. The Energy Dispersive X-ray Analysis confirms the presence of 30.56% of cobalt and 69.44% of iron in cobalt-iron thin film. The study of magnetic properties by Magneto-Optic Kerr Effect technique suggests that sample exhibits soft magnetic behavior. The M–H loop study shows that the coercive field decreases with the increase of rotation of the substrate which may be due to reduced grain size or crystal orientation. The study of remanence magnetization (Mr/Ms) confirms that the sample has a twofold magnetic structure and cubic magnetic anisotropy. The occurrence of the magnetization reversal in the sample is due to the formation of the ripples and change in the contrast in the color of domain images along the easy axis and through coherent rotation of spins along the hard axis. This confirms that the sample has uniaxial nature and found very useful applications in the magnetic sensors, memory storage devices and spintronics.



中文翻译:

钴铁薄膜的磁各向异性和磁化反转

摘要

使用直流磁控溅射沉积单元将钴铁薄膜沉积在旋转的硅(100)基板上。通过掠入射X射线衍射检查该结构,结果表明该样品具有晶格常数为2.65的bcc晶体结构。X射线反射率数据分析证实薄膜合金的厚度为约33nm。能量色散X射线分析证实钴铁薄膜中存在30.56%的钴和69.44%的铁。磁光克尔效应技术对磁性的研究表明,样品表现出软磁行为。M–H回路研究表明,矫顽场随着基板旋转的增加而减小,这可能是由于晶粒尺寸或晶体取向减小所致。剩磁的研究(Mr / M s)确认样品具有双重磁性结构和立方磁各向异性。样品中发生磁化反转的原因是由于形成了波纹,并且沿易轴并通过自旋沿相干轴的相干旋转,使畴图像的颜色的对比度发生了变化。这证实了样品具有单轴性质,并在磁传感器,存储器存储设备和自旋电子学中发现了非常有用的应用。

更新日期:2021-03-25
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